Metrologia
Metrologia is the leading international journal in pure and applied metrology, specialising in the more fundamental aspects of measurement, especially in improving standards for the SI base units. Metrologia is published in partnership with the Bureau International des Poids et Mesures (BIPM).
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Methods for the assessment of correction for chemical-impurity effects and related uncertainty in ITS-90 fixed points, namely of e-H2, Ne, O2 and Ar
Author(s): Franco Pavese
Affiliation(s): Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy
Affiliation(s): Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy
Categories: Metrication News
Synchrotron radiation-based bilateral intercomparison of ultraviolet source calibrations
Author(s): U Arp, R Klein, Z Li, W Paustian, M Richter, P-S Shaw and R Thornagel
Affiliation(s): Electron and Optical Physics Division, National Institute of Standards and Technology, 100 Bureau Dr, MS 8410, Gaithersburg, MD 20899-8410, USA; Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12, D-10587 Berlin, Germany
Affiliation(s): Electron and Optical Physics Division, National Institute of Standards and Technology, 100 Bureau Dr, MS 8410, Gaithersburg, MD 20899-8410, USA; Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12, D-10587 Berlin, Germany
Categories: Metrication News
Investigation of differently designed Pd–C eutectic fixed-point cells for the calibration of thermocouples
Author(s): F Edler and W Zheng
Affiliation(s): Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, 10587 Berlin, Germany; National Institute of Metrology, (NIM), No 18, Beisanhuan Donglu, Beijing 100013, People's Republic of China
Affiliation(s): Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, 10587 Berlin, Germany; National Institute of Metrology, (NIM), No 18, Beisanhuan Donglu, Beijing 100013, People's Republic of China
Categories: Metrication News
Final report on the Seventh International Comparison of Absolute Gravimeters (ICAG 2005)
Author(s): Z Jiang, O Francis, L Vitushkin, V Palinkas, A Germak, M Becker, G D'Agostino, M Amalvict, R Bayer, M Bilker-Koivula, S Desogus, J Faller, R Falk, J Hinderer, C Gagnon, T Jakob, E Kalish, J Kostelecky, Chiungwu Lee, J Liard, Y Lokshyn, B Luck, J Makinen, S Mizushima, N Le Moigne, C Origlia, E R Pujol, P Richard, L Robertsson, D Ruess, D Schmerge, Y Stus, S Svitlov, S Thies, C Ullrich, M Van Camp, A Vitushkin, W Ji and H Wilmes
Affiliation(s): Bureau International des Poids et Mesures (BIPM), Sevres, France; Faculty of Science, Technology and Communication, University of Luxembourg, Luxembourg; Geodetic Observatory Pecny (GOP), Research Institute of Geodesy, Topography and Cartography, Ondrejov, Czech Republic; National Institute of Metrological Research (INRiM), Torino, Italy; Institute of Physical Geodesy, Darmstadt University of Technology (IPGD), Darmstadt, Germany; Ecole et Observatoire des Sciences de la Terre (EOST), Strasbourg, France; Dynamics of the Lithosphere Laboratory CNRS/Montpellier University, Montpellier, France; Finnish Geodetic Institute (FGI), Masala, Finland; JILA, University of Colorado-National Institute of Standards and Technology (NIST), Boulder, CO, USA; Federal Agency of Cartography and Geodesy (BKG), Frankfurt/Main, Germany; Natural Resources Canada (NRCan), Ottawa, Canada; Institute for Automation and Electronics, Russian Academy of Sciences, Novosibirsk, Russian Federation; Center for Measurement Standards, Industrial Technology Research Institute (CMS/ITRI), Chinese Taipei, Taiwan; National Scientific Centre 'Institute of Metrology', Kharkov, Ukraine; National Metrology Institute of Japan, National Institute for Advanced Industrial Sciences and Technology (NMIJ/AIST), Tsukuba, Japan; Instituto Geografico Nacional (IGN), Madrid, Spain; Federal Office of Metrology (METAS), Bern-Wabern, Switzerland; Federal Office of Metrology and Surveying (BEV), Vienna, Austria; United States Geological Survey, Longmont, CO, USA; Royal Observatory of Belgium (ROB), Brussels, Belgium; AOSense, Inc., Sunnyvale, CA, USA; National Institute of Metrology (NIM), Beijing, People's Republic of China
Affiliation(s): Bureau International des Poids et Mesures (BIPM), Sevres, France; Faculty of Science, Technology and Communication, University of Luxembourg, Luxembourg; Geodetic Observatory Pecny (GOP), Research Institute of Geodesy, Topography and Cartography, Ondrejov, Czech Republic; National Institute of Metrological Research (INRiM), Torino, Italy; Institute of Physical Geodesy, Darmstadt University of Technology (IPGD), Darmstadt, Germany; Ecole et Observatoire des Sciences de la Terre (EOST), Strasbourg, France; Dynamics of the Lithosphere Laboratory CNRS/Montpellier University, Montpellier, France; Finnish Geodetic Institute (FGI), Masala, Finland; JILA, University of Colorado-National Institute of Standards and Technology (NIST), Boulder, CO, USA; Federal Agency of Cartography and Geodesy (BKG), Frankfurt/Main, Germany; Natural Resources Canada (NRCan), Ottawa, Canada; Institute for Automation and Electronics, Russian Academy of Sciences, Novosibirsk, Russian Federation; Center for Measurement Standards, Industrial Technology Research Institute (CMS/ITRI), Chinese Taipei, Taiwan; National Scientific Centre 'Institute of Metrology', Kharkov, Ukraine; National Metrology Institute of Japan, National Institute for Advanced Industrial Sciences and Technology (NMIJ/AIST), Tsukuba, Japan; Instituto Geografico Nacional (IGN), Madrid, Spain; Federal Office of Metrology (METAS), Bern-Wabern, Switzerland; Federal Office of Metrology and Surveying (BEV), Vienna, Austria; United States Geological Survey, Longmont, CO, USA; Royal Observatory of Belgium (ROB), Brussels, Belgium; AOSense, Inc., Sunnyvale, CA, USA; National Institute of Metrology (NIM), Beijing, People's Republic of China
Categories: Metrication News
Bayesian uncertainty analysis for a regression model versus application of GUM Supplement 1 to the least-squares estimate
Author(s): Clemens Elster and Blaza Toman
Affiliation(s): Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12, 10587 Berlin, Germany; Statistical Engineering Division, Information Technology Laboratory, National Institute of Standards and Technology, US Department of Commerce, Gaithersburg, MD, USA
Affiliation(s): Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12, 10587 Berlin, Germany; Statistical Engineering Division, Information Technology Laboratory, National Institute of Standards and Technology, US Department of Commerce, Gaithersburg, MD, USA
Categories: Metrication News
Investigations at INRIM on a Pd–C cell manufactured by NPL
Author(s): M Battuello, M Florio and G Machin
Affiliation(s): Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy; National Physical Laboratory (NPL), Teddington, Middlesex TW11 0LW, UK
Affiliation(s): Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy; National Physical Laboratory (NPL), Teddington, Middlesex TW11 0LW, UK
Categories: Metrication News
