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Metrologia

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Metrologia is the leading international journal in pure and applied metrology, specialising in the more fundamental aspects of measurement, especially in improving standards for the SI base units. Metrologia is published in partnership with the Bureau International des Poids et Mesures (BIPM).
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Bayesian assessment of uncertainty in metrology: a tutorial

10 March, 2010 - 19:00
Author(s): I Lira and D Grientschnig
Affiliation(s): Department of Mechanical and Metallurgical Engineering, Pontificia Universidad Catolica de Chile, Vicuna Mackenna 4860, Santiago, Chile; Chemical Laboratories, Boehler Edelstahl, Mariazeller Str. 25, 8605 Kapfenberg, Austria
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Analysis of key comparisons: estimating laboratories' biases by a fixed effects model using Bayesian model averaging

10 March, 2010 - 19:00
Author(s): Clemens Elster and Blaza Toman
Affiliation(s): Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, 10587 Berlin, Germany; Statistical Engineering Division, Information Technology Laboratory, National Institute of Standards and Technology, US Department of Commerce, Gaithersburg, MD, USA
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Primary standard for the calibration of refrigerant leak flow rates

10 March, 2010 - 19:00
Author(s): I Morgado, J C Legras and D Clodic
Affiliation(s): Laboratoire National de Metrologie et d'Essais, 1 rue Gaston Boissier, F 75724 Paris Cedex 15, France; Centre d'Energetique et des Procedes, Ecole des Mines de Paris, 60 bd Saint-Michel, F 75272 Paris Cedex 06, France
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Rectangular distribution whose end points are not exactly known: curvilinear trapezoidal distribution

10 March, 2010 - 19:00
Author(s): Raghu N Kacker and James F Lawrence
Affiliation(s): National Institute of Standards and Technology, Gaithersburg, MD 20899, USA; Department of Mathematics, George Mason University, Fairfax, VA 22030, USA
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ISO terminological analysis of the VIM3 concepts 'quantity' and 'kind-of-quantity'

10 March, 2010 - 19:00
Author(s): Rene Dybkaer
Affiliation(s): Department of Standardization in Laboratory Medicine, Region H Frederiksberg Hospital, Nordre Fasanvej 57, DK-2000 Frederiksberg, Denmark
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Metrology of airborne and liquid-borne nanoparticles: current status and future needs

7 March, 2010 - 19:00
Author(s): Kensei Ehara and Hiromu Sakurai
Affiliation(s): National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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Traceability in hardness measurements: from the definition to industry

7 March, 2010 - 19:00
Author(s): Alessandro Germak, Konrad Herrmann and Samuel Low
Affiliation(s): Istituto Nazionale di Ricerca Metrologica (INRIM), strada delle cacce 73, I-10135 Torino, Italy; Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, D-38116 Braunschweig, Germany; National Institute of Standards and Technology (NIST), 100 Bureau Drive, Stop 8553, Gaithersburg, MD 20899-8553, USA
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Metrology of photoluminescent materials

7 March, 2010 - 19:00
Author(s): Joanne C Zwinkels
Affiliation(s): National Research Council of Canada, Institute for National Measurement Standards, 1200 Montreal Road, Ottawa, Ontario, Canada
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Evolving needs for metrology in material property measurements—the conclusions of the CIPM Working Group on Materials Metrology

7 March, 2010 - 19:00
Author(s): Seton Bennett and Graham Sims
Affiliation(s): National Physical Laboratory, Teddington TW11 0LW, UK
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A traceability scheme for materials metrology

7 March, 2010 - 19:00
Author(s): Jose Antonio Salas-Tellez, Juan Antonio Guardado-Perez, Fernando Rosas-Gutierrez and Yoshito Mitani
Affiliation(s): Centro Nacional de Metrologia, km 4.5, Carretera a Los Cues, El Marques, QRO, CP 76246, Mexico
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Elastic modulus measurement—obtaining reliable data from the tensile test

7 March, 2010 - 19:00
Author(s): J D Lord and R M Morrell
Affiliation(s): National Physical Laboratory, Teddington, Middlesex, TW11 0LW, UK
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Measurements of magnetic materials

7 March, 2010 - 19:00
Author(s): Fausto Fiorillo
Affiliation(s): Istituto Nazionale di Ricerca Metrologica (INRIM), Strada delle Cacce 91, 10135 Torino, Italy
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Establishment of traceability in the measurement of the mechanical properties of materials

7 March, 2010 - 19:00
Author(s): Gun Woong Bahng, Jong Jip Kim, Hae Moo Lee and Yong Hak Huh
Affiliation(s): Korea Research Institute of Standards and Science, PO Box 102, Yuseong, Daejeon, 305-600, Korea
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Metrological traceability of the measured values of properties of engineering materials

7 March, 2010 - 19:00
Author(s): G Roebben, T Linsinger, A Lamberty and H Emons
Affiliation(s): Institute for Reference Materials and Measurements (IRMM), Joint Research Centre, European Commission, Retieseweg 111, B-2440 Geel, Belgium
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Challenges in microstructural metrology for advanced engineered materials

7 March, 2010 - 19:00
Author(s): K P Mingard, B Roebuck, P Quested and E G Bennett
Affiliation(s): National Physical Laboratory, Industry and Innovation Division, Hampton Road, Teddington, Middlesex, TW11 0LW, UK
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Measurements and data of thermophysical properties traceable to a metrological standard

7 March, 2010 - 19:00
Author(s): Tetsuya Baba
Affiliation(s): National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba Central 3, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
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CIRP sponsored international comparison on nanoindentation

7 March, 2010 - 19:00
Author(s): K Herrmann, D A Lucca, M J Klopfstein and F Menelao
Affiliation(s): Physikalisch-Technische Bundesanstalt, Braunschweig und Berlin, Bundesallee 100, 38116 Braunschweig, Germany; Oklahoma State University, Mechanical and Aerospace Engineering, 218 Engineering North, Stillwater, OK 74078-5016, USA; LFM, Badgasteiner Str. 2, 28359 Bremen, Germany
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The determination of the uncertainties of spectral emissivity measurements in air at the PTB

7 March, 2010 - 19:00
Author(s): Christian Monte and Jorg Hollandt
Affiliation(s): Physikalisch-Technische Bundesanstalt (PTB), Abbestrasse 2-12, D-10587 Berlin, Germany
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Materials metrology

7 March, 2010 - 19:00
Author(s): Seton Bennett and Joaquin Valdes
Affiliation(s): National Physical Laboratory, Teddington, UK; Instituto Nacional de Tecnologia Industrial, Buenos Aires, Argentina
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Techniques for measuring the microwave dielectric properties of materials

7 March, 2010 - 19:00
Author(s): Udo Kaatze
Affiliation(s): Drittes Physikalisches Institut, Georg August Universitat, Friedrich-Hund-Platz 1, 37 077 Gottingen, Germany
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