Author(s): Marius Birsan
Affiliation(s): Defence R&D Canada-Atlantic, PO Box 1012, Dartmouth, Nova Scotia, Canada B2Y 3Z7

Author(s): Paulo T Neves Jr, Carlos A Bavastri, Jucelio T Pereira, Roberson A Oliveira, Alexandre A P Pohl, Djones A Boni and Marco A Luersen
Affiliation(s): Federal University of Technology, Parana, Toledo, PR, Brazil; Federal University of Parana, Centro Politecnico, Curitiba, PR, Brazil; Federal University of Technology, Parana, Curitiba, PR, Brazil

Author(s): Zhien Zhu, Yewen Zhang, Zhenlian An and Feihu Zheng
Affiliation(s): Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, Pohl Institute of Solid State Physics, Tongji University, 1239 Siping Road, Shanghai 200092, People's Republic of China

Author(s): Yannick Stebler, Stephane Guerrier, Jan Skaloud and Maria-Pia Victoria-Feser
Affiliation(s): Geodetic Engineering Laboratory, Swiss Federal Institute of Technology, Lausanne, Switzerland; Research Center for Statistics, University of Geneva, Geneva, Switzerland

Author(s): Steffan Puwal and Bradley J Roth
Affiliation(s): Department of Physics, Oakland University, Rochester, MI 48309, USA

Author(s): Zhengjun Wan, Junbi Liao, Gui Yun Tian and Liang Cheng
Affiliation(s): Department of Measurement and Control, Sichuan University, Chengdu 610065, People's Republic of China; School of Electrical, Electronic and Computer Engineering, Newcastle University, NE1 7RU, UK

Author(s): Hiromu Sakurai, Keizo Saito, Tsuyoshi Taishi and Tetsuji Koyama
Affiliation(s): National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan; Tsukasa Sokken Co., Ltd, Tokyo, Japan

Author(s): Koji Asami
Affiliation(s): Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011, Japan

Author(s): Radislav A Potyrailo, Cheryl Surman, David Monk, William G Morris, Timothy Wortley, Mark Vincent, Rafael Diana, Vincent Pizzi, Jeffrey Carter, Gerard Gach, Staffan Klensmeden and Hanno Ehring
Affiliation(s): General Electric Global Research, Niskayuna, NY, USA; GE Healthcare, Life Sciences Biotechnologies, Westborough, MA, USA; GE Healthcare, Life Sciences Biotechnologies, Uppsala, Sweden

Author(s): Naeem S Mian, Simon Fletcher, Andrew P Longstaff and Alan Myers
Affiliation(s): University of Huddersfield, Queensgate, Huddersfield HD1 3DH, UK

Author(s): Yoichiro Iwasaki, Shinya Kawata and Toshiyuki Nakamiya
Affiliation(s): Department of Electronics and Intelligent Systems Engineering, Faculty of Industrial Engineering, Tokai University, 9-1-1 Toroku, Kumamoto 862-8652, Japan; 603-11 Oaza Hikimizu, Ozu-machi, Kikuchi-gun, Kumamoto Prefecture 869-1234, Japan

Author(s): Rui Yi Que, Rong Zhu, Qing Zhen Wei and Zhe Cao
Affiliation(s): State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments and Mechanology, Tsinghua University, Beijing, People's Republic of China

Author(s): Wenchuan Guo, Yi Liu, Xinhua Zhu and Hong Zhuang
Affiliation(s): College of Mechanical and Electronic Engineering, Northwest A&F University, Yangling, Shaanxi 712100, People's Republic of China; US Department of Agriculture, Agricultural Research Service, Russell Research Center, PO Box 5677, Athens, GA 30604-5677, USA

Author(s): Dirk Voigt, Jan L W A van Geel and Oswin Kerkhof
Affiliation(s): VSL Dutch Metrology Institute, Delft, The Netherlands

Author(s): Emily L Wilson, Marc Neveu, Haris Riris, Elena M Georgieva and William S Heaps
Affiliation(s): NASA Goddard Space Flight Center, Laser and Electro-Optics Branch, Greenbelt, MD 20771, USA; NASA Academy, Goddard Space Flight Center, Greenbelt, MD 20771, USA; Institut Superieur de l'Aeronautique et de l'Espace, Toulouse, France; University of Maryland Baltimore County, Baltimore, MD 21250, USA

Author(s): L Baglivo, N Biasi, F Biral, N Bellomo, E Bertolazzi, M Da Lio and M De Cecco
Affiliation(s): Department of Mechanical and Structural Engineering, University of Trento, via Mesiano 77, 38100 Trento, Italy; CISAS, University of Padova, via Venezia 41, 35100 Padova, Italy

Author(s): D Dardas, W Kuczynski, J Hoffmann and W Jezewski
Affiliation(s): Institute of Molecular Physics, Polish Academy of Sciences, Smoluchowskiego 17, 60-179 Poznan, Poland

Author(s): Jerzy Krupka, Danh Nguyen and Janina Mazierska
Affiliation(s): Warsaw University of Technology, Poland; Lehighton Electronics, Inc. Lehighton, PA 18235-0328, USA; School of Engineering and Physical Sciences, James Cook University, Townsville, Australia

Author(s): Hu-Tian Feng, Yu-Lin Wang, Chun-Mei Li and Wei-Jun Tao
Affiliation(s): School of Mechanical Engineering, Nanjing University of Science and Technology, People's Republic of China

Author(s): M Euler, T Kissel, A Dreizler and J Brubach
Affiliation(s): Fachgebiet Reaktive Stromungen und Messtechnik, Center of Smart Interfaces (CSI), Technische Universitat Darmstadt, Petersenstrasse 32, Darmstadt 64287, Germany